Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
FormFactor FORM is leaving no stone unturned to expand semiconductor wafer probe card production. This is evident from the recent opening of the company’s new probe card manufacturing facility in ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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