Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

High discharge density was achieved in high-quality relaxor ferroelectric BNT-based ceramics through a combination of chemical doping, hierarchical structure design, advanced sintering technology, and ...

• Ferroelectric–Nonferroelectric Transition: When the capacitor size is reduced to 3.85 μm, ferroelectricity vanishes and an ultrahigh dielectric permittivity of 1466 emerges, without requiring ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...