A new technical paper titled “Efficient and Scalable Post-Layout Optimization for Field-coupled Nanotechnologies” was published by researcher at the Technical University of Munich (TUM). “As ...
With the increasing complexity of design layouts and shorter tapeout cycles, waiting until signoff verification to check design reliability is no longer practical for design teams. Designers must now ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback